![[IEEE IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings - Ottawa, Ont., Canada (19-21 May 1997)] IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings - The effective resolution measurement in scope of sine-fit test]()
[IEEE IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings - Ottawa, Ont., Canada (19-21 May 1997)] IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings - The effective resolution measurement in scope of sine-fit testHejn, K.; Kramarski, L.; Pacut, A. · 1997