Accelerated Failure Time Models for Counting Processes
- 期刊名称Biometrika
- 作者D. Y. Lin, L. J. Wei and Zhiliang Ying
- 卷第85卷
- 期第3期
- 印刷ISSN0006-3444
- 文件大小1188.22KB
- 发表时间1998-09
- DOI10.2307/2337390
- 页码605-618
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