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[IEEE 28th European Microwave Conference, 1998 - Amsterdam, Netherlands (1998.10.4-1998.10.6)] 28th European Microwave Conference, 1998 - Compensating Differences Between Measurement and Calibation Wafer in Probe Tip Calibrations - Deembedding of Line Parameters

[IEEE 28th European Microwave Conference, 1998 - Amsterdam, Netherlands (1998.10.4-1998.10.6)] 28th European Microwave Conference, 1998 - Compensating Differences Between Measurement and Calibation Wafer in Probe Tip Calibrations - Deembedding of Line Parameters

Carchon, G.; Schreurs, D.; Vandenberghe, S.; Nauwelaers, B.; De Raedt, W.

作者Carchon, G.; Schreurs, D.; Vandenberghe, S.; Nauwelaers, B.; De Raedt, W.
文件大小5668.97KB
发表时间1998
DOI10.1109/euma.1998.337997
页码259-264

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