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[IEEE Comput. Soc 16th IEEE VLSI Test Symposium - Monterey, CA, USA (26-30 April 1998)] Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) - Distributed generation of weighted random patterns

[IEEE Comput. Soc 16th IEEE VLSI Test Symposium - Monterey, CA, USA (26-30 April 1998)] Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) - Distributed generation of weighted random patterns

Savir, J.

作者Savir, J.
文件大小165.10KB
发表时间1998
DOI10.1109/vtest.1998.670872
页码225-232

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