[IEEE 2nd Electronics Packaging Technology Conference - Singapore (8-10 Dec. 1998)] Proceedings of 2nd Electronics Packaging Technology Conference (Cat. No.98EX235) - Reliability assessment of transfer molded CSP
Lee, T.K.; Teo, Y.C.; Lim, T.B.
- 作者Lee, T.K.; Teo, Y.C.; Lim, T.B.
- 文件大小503.45KB
- 发表时间1998
- DOI10.1109/EPTC.1998.756015
- 页码274-278