[IEEE Comput. Soc 16th IEEE VLSI Test Symposium - Monterey, CA, USA (26-30 April 1998)] Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) - On synchronizing sequences and test sequence partitioning
Pomeranz, I.; Reddy, S.M.
- 作者Pomeranz, I.; Reddy, S.M.
- 文件大小70.50KB
- 发表时间1998
- DOI10.1109/vtest.1998.670864
- 页码158-167