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[IEEE Comput. Soc 16th IEEE VLSI Test Symposium - Monterey, CA, USA (26-30 April 1998)] Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) - COMPACT: a hybrid method for compressing test data

[IEEE Comput. Soc 16th IEEE VLSI Test Symposium - Monterey, CA, USA (26-30 April 1998)] Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) - COMPACT: a hybrid method for compressing test data

Ishida, M.; Ha, D.S.; Yamaguchi, T.

作者Ishida, M.; Ha, D.S.; Yamaguchi, T.
文件大小54.81KB
发表时间1998
DOI10.1109/vtest.1998.670850
页码62-69

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