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[IEEE ASDAM '98. Conference Proceedings. Second International Conference on Advances Semiconductor Devices and Microsystems - Smolenice Castle, Slovakia (5-7 Oct. 1998)] ASDAM '98. Conference Proceedings. Second International Conference on Advanced Semiconductor Devices and Microsystems (Cat. No.98EX172) - Macrostress formation in thin films and its investigation by X-ray diffraction

[IEEE ASDAM '98. Conference Proceedings. Second International Conference on Advances Semiconductor Devices and Microsystems - Smolenice Castle, Slovakia (5-7 Oct. 1998)] ASDAM '98. Conference Proceedings. Second International Conference on Advanced Semiconductor Devices and Microsystems (Cat. No.98EX172) - Macrostress formation in thin films and its investigation by X-ray diffraction

Sutta, P.; Jackuliak, Q.
  • 作者Sutta, P.; Jackuliak, Q.
  • 文件大小335.35KB
  • 发表时间1998
  • DOI10.1109/asdam.1998.730205
  • 页码227-230
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