X-ray photoelectron spectroscopy and spectral transmittance study of stoichiometry in sputtered vanadium oxide films
- 作者M. Ghanashyam Krishna; Y. Debauge; A.K. Bhattacharya
- 卷第312卷
- 印刷ISSN0040-6090
- 文件大小587.17KB
- 发表时间1998
- DOI10.1016/s0040-6090(97)00717-7
- 页码116-122