The extended OPAL silicon strip microvertex detector
S. Anderson; J.R. Batley; G.A. Beck; T. Behnke; M. Bobinski; A.A. Carter; J.R. Carter; S.J. de Jong; U.C. Dunwoody; V. Gibson; W. Glessing; M.J. Goodrick; E. Gross; R. Hammarström; G.G. Hanson; M. Hapke; A.K. Honma; F. Jacob; M. Jiminez; C.R. Jones; P. Jovanovic; T. Junk; P. Kyberd; J.A. Lauber; A.J. Martin; A. McNab; R. Mir; K. Mühlemann; T.W. Pritchard; D.R. Rust; R. Van Kooten
- 作者S. Anderson; J.R. Batley; G.A. Beck; T. Behnke; M. Bobinski; A.A. Carter; J.R. Carter; S.J. de Jong; U.C. Dunwoody; V. Gibson; W. Glessing; M.J. Goodrick; E. Gross; R. Hammarström; G.G. Hanson; M. Hapke; A.K. Honma; F. Jacob; M. Jiminez; C.R. Jones; P. Jovanovic; T. Junk; P. Kyberd; J.A. Lauber; A.J. Martin; A. McNab; R. Mir; K. Mühlemann; T.W. Pritchard; D.R. Rust; R. Van Kooten
- 卷第403卷
- 印刷ISSN0168-9002
- 文件大小2230.06KB
- 发表时间1998
- DOI10.1016/s0168-9002(97)01093-0
- 页码326-350