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[IEEE IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222) - St. Paul, MN, USA (18-21 May 1998)] IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222) - Dynamic error characteristics of touch trigger probes fitted to coordinate measuring machines

[IEEE IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222) - St. Paul, MN, USA (18-21 May 1998)] IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222) - Dynamic error characteristics of touch trigger probes fitted to coordinate measuring machines

Johnson, R.P.; Yang, Q.; Butler, C.

作者Johnson, R.P.; Yang, Q.; Butler, C.
卷第2卷
文件大小497.33KB
发表时间1998
DOI10.1109/imtc.1998.676895
页码1104-1109

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