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New Tight-Binding Method for Simulation of Defect Configurations, Creation and Diffusion Mechanisms in Solids: Application to Silicon

New Tight-Binding Method for Simulation of Defect Configurations, Creation and Diffusion Mechanisms in Solids: Application to Silicon

Khakimov, Zokirkhon M.

期刊名称MRS Proceedings
作者Khakimov, Zokirkhon M.
卷第532卷
电子ISSN1946-4274
文件大小490.90KB
发表时间1998-1
DOI10.1557/proc-532-205

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