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SPIE Proceedings [SPIE Photonics China '98 - Beijing, China (Wednesday 16 September 1998)] Photorefractive Materials: Phenomena and Related Applications II - New method for identification of impurity levels in photorefractive crystals

Song, Hongwei; Chi, Mingjun; Dou, Shuoxing; Zhu, Yong; Ye, Peixian; Ye, Peixian; Shimura, Tsutomu; Neurgaonkar, Ratnakar R.

作者Song, Hongwei; Chi, Mingjun; Dou, Shuoxing; Zhu, Yong; Ye, Peixian; Ye, Peixian; Shimura, Tsutomu; Neurgaonkar, Ratnakar R.
卷第3554卷
印刷ISSN0277-786X
文件大小290.50KB
发表时间1998
DOI10.1117/12.318126
页码232-235

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SPIE Proceedings [SPIE Photonics China '98 - Beijing, China (Wednesday 16 September 1998)] Photorefractive Materials: Phenomena and Related Applications II - New method for identification of impurity levels in photorefractive crystals