Summary of ISO/TC 201 standards: introduction
- 期刊名称Surface and Interface Analysis
- 作者Powell, C. J.; Shimizu, R.
- 卷第27卷
- 期第7期
- 印刷ISSN0142-2421
- 电子ISSN1096-9918
- 文件大小23.75KB
- 发表时间1999-07
- DOI10.1002/(sici)1096-9918(199907)27:7<691::aid-sia639>3.0.co;2-t
- 页码691-692
Electrostatic force at mica surfaces proved by frequency-shift spectroscopyYasuhisa Naito; Yasushi Maeda; Takuya Matsumoto; Tomoji Kawai · 2000
Reduction of Long-range Interactions using Carbon Nanotube Probes in Biological SystemsMaeda, Yasushi; Nishijima, Hidehiro; Akita, Seiji; Matsumoto, Takuya; Nakayama, Yoshikazu; Kawai, Tomoji · Japanese Journal of Applied Physics · 2001
Imaging of the DNA (deoxyribonucleic acid) Double Helix Structure by Noncontact Atomic Force MicroscopyMaeda, Yasushi; Matsumoto, Takuya; Tanaka, Hiroyuki; Kawai, Tomoji · Japanese Journal of Applied Physics · 1999
Imaging of Transverse Electron Transfer through a DNA Molecule by Simultaneous Scanning Tunneling and Frequency-Modulation Atomic Force MicroscopyMaeda, Yasushi; Matsumoto, Takuya; Kawai, Tomoji · ACS Nano · 2011
High-resolution imaging of single-stranded DNA on mica surface under ultrahigh vacuum conditions by noncontact atomic force microscopyMatsumoto, Takuya; Maeda, Yasushi; Naitoh, Yasuhisa; Kawai, Tomoji · 1999
PrefaceGRANT, JOHN T. · Surface and Interface Analysis · 1997
PrefaceFriedbacher, Gernot; Fuchs, Harold; G�untherodt, Hans-Joachim · Surface and Interface Analysis · 1997
PrefaceMarkwitz, A.; Matz, W.; Waldschmidt, M.; Demortier, G. · Surface and Interface Analysis · 1998
Overlayer corrections in XPSZalm, P. C. · Surface and Interface Analysis · 1998
EditorialBriggs (Editor-in-Chief), David · Surface and Interface Analysis · 1998
PrefaceVanden Eynde, X.; Bertrand, P. · Surface and Interface Analysis · 1999
PrefaceBennewitz, R.; Meyer, E. · Surface and Interface Analysis · 1999
EditorialBriggs, David · Surface and Interface Analysis · 1999