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Electric field and temperature dependence of the stress induced leakage current: Fowler–Nordheim or Schottky emission?

Electric field and temperature dependence of the stress induced leakage current: Fowler–Nordheim or Schottky emission?

P. Riess; G. Ghibaudo; G. Pananakakis; J. Brini; G. Ghidini
  • 作者P. Riess; G. Ghibaudo; G. Pananakakis; J. Brini; G. Ghidini
  • 卷第245卷
  • 印刷ISSN0022-3093
  • 文件大小181.50KB
  • 发表时间1999
  • DOI10.1016/s0022-3093(98)00853-9
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