[AEA Technol Third European Conference on High Temperature Electronics - Berlin, Germany (4-7 July 1999)] HITEN 99. Third European Conference on High Temperature Electronics. (IEEE Cat. No.99EX372) - Temperature dependence of avalanche breakdown in GaAs p-i-n diodes
David, J.P.R.; Ghin, R.; Plimmer, S.A.; Rees, G.J.; Grey, R.
- 作者David, J.P.R.; Ghin, R.; Plimmer, S.A.; Rees, G.J.; Grey, R.
- 文件大小287.73KB
- 发表时间1999
- DOI10.1109/hiten.1999.827492
- 页码187-190