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Analysis of contamination, hydrogen emission, and surface temperature variations using real time spectroscopic ellipsometry during p/i interface formation in amorphous silicon p-i-n solar cells

Analysis of contamination, hydrogen emission, and surface temperature variations using real time spectroscopic ellipsometry during p/i interface formation in amorphous silicon p-i-n solar cells

Fujiwara, H.; Koh, Joohyun; Wronski, C. R.; Collins, R. W.

期刊名称Applied Physics Letters
作者Fujiwara, H.; Koh, Joohyun; Wronski, C. R.; Collins, R. W.
卷第74卷
期第24期
印刷ISSN0003-6951
文件大小271.34KB
发表时间1999
DOI10.1063/1.123230

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