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$SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications V - <title>Precise measurement of the amplitude of photorefractive index gratings</title>$

SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications V - Precise measurement of the amplitude of photorefractive index gratings

Sun, Ching-Cherng; Tu, Chung-Chen; Chen, M. C.; Chung, Peing T.; Donn, Shoang C.; Yu, Francis T. S.; Yin, Shizhuo

作者Sun, Ching-Cherng; Tu, Chung-Chen; Chen, M. C.; Chung, Peing T.; Donn, Shoang C.; Yu, Francis T. S.; Yin, Shizhuo
卷第3801卷
印刷ISSN0277-786X
文件大小227.54KB
发表时间1999
DOI10.1117/12.363946
页码53-57

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