SPIE Proceedings [SPIE Laser-Induced Damage in Optical Materials: 1998 - Boulder, CO (Monday 28 September 1998)] Laser-Induced Damage in Optical Materials: 1998 - National round-robin test on laser induced damage at 1.064 μm: revised data reduction and correlation analysis

Arenberg, Jonathan W.; Riede, Wolfgang; Broulik, Ulrike; Steiger, Bernhard; Willamowski, Uwe; Ristau, Detlev; Exarhos, Gregory J.; Guenther, Arthur H.; Kozlowski, Mark R.; Lewis, Keith L.; Soileau, M. J.

作者Arenberg, Jonathan W.; Riede, Wolfgang; Broulik, Ulrike; Steiger, Bernhard; Willamowski, Uwe; Ristau, Detlev; Exarhos, Gregory J.; Guenther, Arthur H.; Kozlowski, Mark R.; Lewis, Keith L.; Soileau, M. J.
卷第3578卷
印刷ISSN0277-786X
文件大小577.53KB
发表时间1999
DOI10.1117/12.344410
页码645-656

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SPIE Proceedings [SPIE Laser-Induced Damage in Optical Materials: 1998 - Boulder, CO (Monday 28 September 1998)] Laser-Induced Damage in Optical Materials: 1998 - National round-robin test on laser induced damage at 1.064 μm: revised data reduction and correlation analysis