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Study of Stress-Induced Leakage Current in Thin Oxides Stressed by Corona Charging in Air: Relationship to GOI Defects

Wilson, M.; Lagowski, J.; Savtchou, A.; Marinskiy, D.; Jastrzebski, L.; D'amico, J.

期刊名称MRS Proceedings
作者Wilson, M.; Lagowski, J.; Savtchou, A.; Marinskiy, D.; Jastrzebski, L.; D'amico, J.
卷第592卷
电子ISSN1946-4274
文件大小381.66KB
发表时间1999-1
DOI10.1557/proc-592-345