SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks - Thermal modeling using enthalpy methods to aid in the study of microstructural changes of multilayered phase change optical memories
Nagpal, Swati; Aurora, Aradhna; Podio, Fernando L.
- 作者Nagpal, Swati; Aurora, Aradhna; Podio, Fernando L.
- 卷第3806卷
- 印刷ISSN0277-786X
- 文件大小477.33KB
- 发表时间1999
- DOI10.1117/12.371157
- 页码154-168