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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks - <title>Thermal modeling using enthalpy methods to aid in the study of microstructural changes of multilayered phase change optical memories</title>

SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks - Thermal modeling using enthalpy methods to aid in the study of microstructural changes of multilayered phase change optical memories

Nagpal, Swati; Aurora, Aradhna; Podio, Fernando L.
  • 作者Nagpal, Swati; Aurora, Aradhna; Podio, Fernando L.
  • 卷第3806卷
  • 印刷ISSN0277-786X
  • 文件大小477.33KB
  • 发表时间1999
  • DOI10.1117/12.371157
  • 页码154-168
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