SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Near-Field Optics: Physics, Devices, and Information Processing - Mode study of the light emission distribution in semiconductor microdisks by using near-field optical microscopy
Zhang, Yu; Zhu, Xing; Lun, Dai; Zhou, Hetian; Wang, Ruo Peng; Xin, Yongchun; Wang, Guozhong; Xu, Shifa; Shen, Yumin; Zhang, Bei-Wei; Zhang, Guoyi; Gan, Zizhao; Song, Feijun; Jutamulia, Suganda; Ohtsu, Motoichi; Asakura, Toshimitsu
- 作者Zhang, Yu; Zhu, Xing; Lun, Dai; Zhou, Hetian; Wang, Ruo Peng; Xin, Yongchun; Wang, Guozhong; Xu, Shifa; Shen, Yumin; Zhang, Bei-Wei; Zhang, Guoyi; Gan, Zizhao; Song, Feijun; Jutamulia, Suganda; Ohtsu, Motoichi; Asakura, Toshimitsu
- 卷第3791卷
- 印刷ISSN0277-786X
- 文件大小3947.89KB
- 发表时间1999
- DOI10.1117/12.363855
- 页码168-178