Random Testing of Digital Circuits: Theory and Applicationsby Rene David
- 期刊名称Interfaces
- 作者Review by: Antanas Zilinskas
- 卷第29卷
- 期第5期
- 印刷ISSN0092-2102
- 电子ISSN1526-551X
- 文件大小556.77KB
- 发表时间1999-0910
- DOI10.2307/25062527
- 页码145-147
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