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[IEEE Comput. Soc 17th IEEE VLSI Test Symposium - Dana Point, CA, USA (25-29 April 1999)] Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146) - Defect-oriented test scheduling

[IEEE Comput. Soc 17th IEEE VLSI Test Symposium - Dana Point, CA, USA (25-29 April 1999)] Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146) - Defect-oriented test scheduling

Wanli Jiang, ; Vinnakota, B.

作者Wanli Jiang, ; Vinnakota, B.
文件大小115.20KB
发表时间1999
DOI10.1109/vtest.1999.766700
页码433-438

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