[IEEE 1999 Symposium on High Performance Electron Devices for Microwave and Optoelectronic Applications. EDMO - London, UK (22-23 Nov. 1999)] 1999 Symposium on High Performance Electron Devices for Microwave and Optoelectronic Applications. EDMO (Cat. No.99TH8401) - High-field phenomena and reliability issues in microwave heterojunction FETs
- 作者Menozzi, R.
- 文件大小460.09KB
- 发表时间1999
- DOI10.1109/edmo.1999.821463
- 页码75-80
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