SiC Recession Caused by SiO2 Scale Volatility under Combustion Conditions: II, Thermodynamics and Gaseous-Diffusion Model

• 作者Elizabeth J. Opila; James L. Smialek; Raymond C. Robinson; Dennis S. Fox; Nathan S. Jacobson
• 卷第82卷
• 期第7期
• 印刷ISSN0002-7820
• 电子ISSN1551-2916
• 文件大小227.41KB
• 发表时间1999
• DOI10.1111/j.1151-2916.1999.tb02005.x
• 页码1826-1834