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Effect of thermal annealing conditions on the microdefect formation in undoped GaAs single crystals grown by Czochralski method

Effect of thermal annealing conditions on the microdefect formation in undoped GaAs single crystals grown by Czochralski method

V. T. Bublik; M. I. Voronova; A. V. Markov; K. D. Shcherbachev
  • 作者V. T. Bublik; M. I. Voronova; A. V. Markov; K. D. Shcherbachev
  • 卷第45卷
  • 期第5期
  • 印刷ISSN1063-7745
  • 电子ISSN1562-689X
  • 文件大小89.47KB
  • 发表时间2000-09
  • DOI10.1134/1.1312929
  • 页码821-826
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