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Scanning tunneling microscopy of the nonequilibrium interaction of impurity states at semiconductor surfaces

Scanning tunneling microscopy of the nonequilibrium interaction of impurity states at semiconductor surfaces

P. I. Arseev; N. S. Maslova; S. I. Oreshkin; V. I. Panov; S. V. Savinov
  • 作者P. I. Arseev; N. S. Maslova; S. I. Oreshkin; V. I. Panov; S. V. Savinov
  • 卷第72卷
  • 期第11期
  • 印刷ISSN0021-3640
  • 电子ISSN1090-6487
  • 文件大小129.96KB
  • 发表时间2000-12
  • DOI10.1134/1.1348482
  • 页码565-568
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