Development of the Scanning Atom Probe and Atomic Level Analysis

Osamu Nishikawa; Yoshikatsu Ohtani; Kiyoshi Maeda; Masafumi Watanabe; Keiji Tanaka

作者Osamu Nishikawa; Yoshikatsu Ohtani; Kiyoshi Maeda; Masafumi Watanabe; Keiji Tanaka
卷第44卷
印刷ISSN1044-5803
文件大小5091.32KB
发表时间2000
DOI10.1016/s1044-5803(99)00046-7
页码29-57

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