Hot hole transport through Au/n-Si(100) studied by reverse ballistic electron emission microscopy and spectroscopy
- 作者A. Chahboun; R. Coratger; R. Pechou; F. Ajustron; J. Beauvillain
- 卷第462卷
- 印刷ISSN0039-6028
- 文件大小400.83KB
- 发表时间2000
- DOI10.1016/s0039-6028(00)00537-9
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