[IEEE 2000 Third IEEE International Caracas Conference on Devices, Circuits and Systems - Cancun, Mexico (15-17 March 2000)] Proceedings of the 2000 Third IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.00TH8474) - Characterisation of radiation effects on MOSFET using genetic algorithms
- 作者Picos, R.; Roca, M.; Calvo, O.; Garcia-Moreno, E.
- 文件大小428.62KB
- 发表时间2000
- DOI10.1109/iccdcs.2000.869842
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