Editorial board
- 期刊名称Civil Wars
- 卷第3卷
- 期第2期
- 印刷ISSN1369-8249
- 电子ISSN1743-968X
- 文件大小65.21KB
- 发表时间2000-06
- DOI10.1080/13698240008402434
[IEEE 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual - Orlando, FL, USA (2001.05.3-2001.05.3)] 2001 IEEE International Reliability Physics Symposium Proceedings 39th Annual (Cat No 00CH37167) RELPHY-0 - 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167)2001
[IEEE 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual - Orlando, FL, USA (2001.05.3-2001.05.3)] 2001 IEEE International Reliability Physics Symposium Proceedings 39th Annual (Cat No 00CH37167) RELPHY-0 - Biographies2001
[IEEE 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual - Orlando, FL, USA (30 April-3 May 2001)] 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) - Reliability of a MEMS torsional ratcheting actuatorTanner, D.M.; Walraven, J.A.; Barnes, S.M.; Smith, N.F.; Bitsie, F.; Swanson, S.E. · 2001
[IEEE 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual - Orlando, FL, USA (30 April-3 May 2001)] 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) - Calculating the error in long term oxide reliability estimatesLinder, B.P.; Stathis, J.H.; Frank, D.J. · 2001
[IEEE 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual - Orlando, FL, USA (30 April-3 May 2001)] 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) - A fatigue theory for soldersShengmin Wen, ; Keer, L.M. · 2001
[IEEE 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual - Orlando, FL, USA (30 April-3 May 2001)] 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) - Analysis of erratic bits in flash memoriesChimenton, A.; Pellati, P.; Olivo, P. · 2001
[IEEE 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual - Orlando, FL, USA (30 April-3 May 2001)] 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) - Physical and predictive models of ultra thin oxide reliability in CMOS devices and circuitsStathis, J.H. · 2001
[IEEE 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual - Orlando, FL, USA (30 April-3 May 2001)] 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) - An application-specific usage model for flash memory read disturb reliabilityHarp, T.S.; Kuhn, P.J.; Higman, J.M.; Paulsen, R.E.; Hornung, B.E. · 2001