发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

[IEEE Comput. Soc IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Yamanashi, Japan (25-27 Oct. 2000)] Proceedings IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Using run-time reconfiguration for fault injection in hardware prototypes

[IEEE Comput. Soc IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Yamanashi, Japan (25-27 Oct. 2000)] Proceedings IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Using run-time reconfiguration for fault injection in hardware prototypes

Antoni, L.; Leveugle, R.; Feher, B.

作者Antoni, L.; Leveugle, R.; Feher, B.
文件大小507.11KB
发表时间2000
DOI10.1109/dftvs.2000.887181
页码405-413

← 返回【学霸图书馆】主页