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[Int. Test Conference International Test Conference 2000 - Atlantic City, NJ, USA (3-5 Oct. 2000)] Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159) - Multiple-parameter CMOS IC testing with increased sensitivity for I/sub DDQ/

[Int. Test Conference International Test Conference 2000 - Atlantic City, NJ, USA (3-5 Oct. 2000)] Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159) - Multiple-parameter CMOS IC testing with increased sensitivity for I/sub DDQ/

Keshavarzi, A.; Roy, K.; Sachdev, M.; Hawkins, C.F.; Soumyanath, K.; De, V.
  • 作者Keshavarzi, A.; Roy, K.; Sachdev, M.; Hawkins, C.F.; Soumyanath, K.; De, V.
  • 文件大小854.18KB
  • 发表时间2000
  • DOI10.1109/test.2000.894318
  • 页码1051-1059
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