Reliable contacts to two-dimensional conduction layers
- 期刊名称Applied Physics Letters
- 作者Souw, Victor; Li, Shi; McElfresh, M.; Duan, Zhan; McInturff, D.; Yulius, Aristo; Chen, E.-H.; Woodall, J. M.
- 卷第76卷
- 期第22期
- 印刷ISSN0003-6951
- 文件大小370.51KB
- 发表时间2000
- DOI10.1063/1.126615
Micronewton electromagnetic thrusterCharrier, D. S. H. · Applied Physics Letters · 2012
Electrowetting control of bouncing jetsNoblin, Xavier; Celestini, Franck · Applied Physics Letters · 2012
Microstructural heterogeneity and dynamic shear localizationOsovski, S.; Rittel, D. · Applied Physics Letters · 2012
Quantum-secured imagingMalik, Mehul; Magaña-Loaiza, Omar S.; Boyd, Robert W. · Applied Physics Letters · 2012
Graphene-based ferromagnetic superconductorsVahid Hosseini, Mir; Zareyan, Malek · Applied Physics Letters · 2012
Dual electrode cantilevers for ohmic microscopyIgnatowitz, Markus; Oesterschulze, Egbert · Applied Physics Letters · 2012
Superradiant Raman laser magnetometerWeiner, Joshua M.; Cox, Kevin C.; Bohnet, Justin G.; Chen, Zilong; Thompson, James K. · Applied Physics Letters · 2012
Yb3+Er3+ GLASS LASERSnitzer, E.; Woodcock, R. · Applied Physics Letters · 1965