Erratum: “Interdiffusion in NiFe/Cu/NiFe trilayers: Possible failure mechanism for magnetoelectronic devices” [Appl. Phys. Lett. 77, 358 (2000)]
Brückner, W.; Baunack, S.; Hecker, M.; Monch, J.-I.; van Loyen, L.; Schneider, C. M.
- 期刊名称Applied Physics Letters
- 作者Brückner, W.; Baunack, S.; Hecker, M.; Monch, J.-I.; van Loyen, L.; Schneider, C. M.
- 卷第77卷
- 期第7期
- 印刷ISSN0003-6951
- 文件大小207.56KB
- 发表时间2000
- DOI10.1063/1.1290446