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[IEEE Comput. Soc Meeting on Design Automation and Test in Europe - Paris, France (27-30 March 2000)] Proceedings Design, Automation and Test in Europe Conference and Exhibition 2000 (Cat. No. PR00537) - On applying incremental satisfiability to delay fault testing

[IEEE Comput. Soc Meeting on Design Automation and Test in Europe - Paris, France (27-30 March 2000)] Proceedings Design, Automation and Test in Europe Conference and Exhibition 2000 (Cat. No. PR00537) - On applying incremental satisfiability to delay fault testing

Joonyoung Kim, ; Whittemore, J.; Marques-Silva, J.P.; Sakallah, K.

作者Joonyoung Kim, ; Whittemore, J.; Marques-Silva, J.P.; Sakallah, K.
文件大小154.02KB
发表时间2000
DOI10.1109/date.2000.840299
页码380-384

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