SPIE Proceedings [SPIE International Topical Symposium on Advanced Optical Manufacturing and Testing Technology - Chengdu, China (Wednesday 1 November 2000)] Advanced Optical Manufacturing and Testing Technology 2000 - Technology of sagittal-focusing crystal manufacturing and testing the monochromator in synchrotron radiation
Zhou, Renkui; Fu, Xuan; Zhou, Sizhong; Xia, Shaojian; Yang, Li; Pollicove, Harvey M.; Xin, Qiming; Wyant, James C.
- 作者Zhou, Renkui; Fu, Xuan; Zhou, Sizhong; Xia, Shaojian; Yang, Li; Pollicove, Harvey M.; Xin, Qiming; Wyant, James C.
- 卷第4231卷
- 印刷ISSN0277-786X
- 文件大小170.38KB
- 发表时间2000
- DOI10.1117/12.402801
- 页码515-519