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SPIE Proceedings [SPIE Electronic Imaging - San Jose, CA (Saturday 22 January 2000)] Machine Vision Applications in Industrial Inspection VIII - <title>Content-based image retrieval for semiconductor manufacturing</title>

SPIE Proceedings [SPIE Electronic Imaging - San Jose, CA (Saturday 22 January 2000)] Machine Vision Applications in Industrial Inspection VIII - Content-based image retrieval for semiconductor manufacturing

Karnowski, Thomas P.; Tobin, Jr., Kenneth W.; Ferrell, Regina K.; Lakhani, Fred; Tobin, Jr., Kenneth W.
  • 作者Karnowski, Thomas P.; Tobin, Jr., Kenneth W.; Ferrell, Regina K.; Lakhani, Fred; Tobin, Jr., Kenneth W.
  • 卷第3966卷
  • 印刷ISSN0277-786X
  • 文件大小1158.41KB
  • 发表时间2000
  • DOI10.1117/12.380070
  • 页码162-172
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