SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Penetrating Radiation Systems and Applications II - Measurement of coincidence timing resolution with CdTe detectors
Shao, Yiping; Barber, H. Bradford; Balzer, Stephen J.; Cherry, Simon R.; Doty, F. P.; Barber, H. Bradford; Roehrig, Hans; Morton, Edward J.
- 作者Shao, Yiping; Barber, H. Bradford; Balzer, Stephen J.; Cherry, Simon R.; Doty, F. P.; Barber, H. Bradford; Roehrig, Hans; Morton, Edward J.
- 卷第4142卷
- 印刷ISSN0277-786X
- 文件大小259.13KB
- 发表时间2000
- DOI10.1117/12.410570
- 页码254-264