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SPIE Proceedings [SPIE Microelectronic Manufacturing - Santa Clara, CA (Monday 18 September 2000)] Challenges in Process Integration and Device Technology - Increasing degree of homogeneity of electrical parameters of neutron-transmuted silicon

SPIE Proceedings [SPIE Microelectronic Manufacturing - Santa Clara, CA (Monday 18 September 2000)] Challenges in Process Integration and Device Technology - Increasing degree of homogeneity of electrical parameters of neutron-transmuted silicon

Makhkamov, Shermakhmat; Burnett, David; Kimura, Shin'ichiro; Tursunov, Nigmatilla A.; Ashurov, Maripjon; Singh, Bhanwar; Khakimov, Zokirkhon M.
  • 作者Makhkamov, Shermakhmat; Burnett, David; Kimura, Shin'ichiro; Tursunov, Nigmatilla A.; Ashurov, Maripjon; Singh, Bhanwar; Khakimov, Zokirkhon M.
  • 卷第4181卷
  • 印刷ISSN0277-786X
  • 文件大小85.16KB
  • 发表时间2000
  • DOI10.1117/12.395740
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