SPIE Proceedings [SPIE Laser-Induced Damage in Optical Materials: 2000 - Boulder, CO (Monday 16 October 2000)] Laser-Induced Damage in Optical Materials: 2000 - Calculation of relative damage thresholds for total internal reflection surfaces
Arenberg, Jonathan W.; Exarhos, Gregory J.; Guenther, Arthur H.; Kozlowski, Mark R.; Lewis, Keith L.; Soileau, M. J.
- 作者Arenberg, Jonathan W.; Exarhos, Gregory J.; Guenther, Arthur H.; Kozlowski, Mark R.; Lewis, Keith L.; Soileau, M. J.
- 卷第4347卷
- 印刷ISSN0277-786X
- 文件大小460.88KB
- 发表时间2000
- DOI10.1117/12.425065