MOVPE growth of (Al, Ga)InP-based laser structures monitored by real-time reflectance anisotropy spectroscopy

• 作者K. Haberland; A. Bhattacharya; M. Zorn; M. Weyers; J. -T. Zettler; W. Richter
• 卷第29卷
• 期第1期
• 印刷ISSN0361-5235
• 电子ISSN1543-186X
• 文件大小185.27KB
• 发表时间2000
• DOI10.1007/s11664-000-0102-8
• 页码94-98