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RTL-Based Functional Test Generation for High Defects Coverage in Digital Systems

RTL-Based Functional Test Generation for High Defects Coverage in Digital Systems

M.B. Santos; F.M. Gonçalves; I.C. Teixeira; J.P. Teixeira

作者M.B. Santos; F.M. Gonçalves; I.C. Teixeira; J.P. Teixeira
卷第17卷
印刷ISSN0923-8174
电子ISSN1573-0727
文件大小267.51KB
发表时间2001-06
DOI10.1023/a:1012223614418
页码311-319

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