Extraction of the induced gate noise, channel noise, and their correlation in submicron MOSFETs from RF noise measurements
- 作者Chih-Hung Chen; Deen, M.J.; Yuhua Cheng; Matloubian, M.
- 卷第48卷
- 期第12期
- 印刷ISSN0018-9383
- 电子ISSN1557-9646
- 文件大小253.83KB
- 发表时间2001
- DOI10.1109/16.974722
- 页码2884-2892
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