![SPIE Proceedings [SPIE Optical Science, Engineering and Instrumentation '97 - San Diego, CA (Sunday 27 July 1997)] Statistical and Stochastic Methods in Image Processing II - <title>Estimating bidirectional reflectance parameters by forward modeling and statistical inversion of remotely sensed data</title>]()
SPIE Proceedings [SPIE Optical Science, Engineering and Instrumentation '97 - San Diego, CA (Sunday 27 July 1997)] Statistical and Stochastic Methods in Image Processing II - <title>Estimating bidirectional reflectance parameters by forward modeling and statistical inversion of remotely sensed data</title>Fletcher, Robin P.; Grubb, Howard J.; Godsalve, Christopher; Preteux, Francoise J.; Davidson, Jennifer L.; Dougherty, Edward R. · 1997