[JEDEC GaAs Reliability Workshop. - Baltimore, MD, USA (21 Oct. 2001)] 2001 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.01TH8602) - Reliability issues in GaAs-based devices for space applications
Leon, R.; Okuno, J.; Ruiz, R.; Gallegos, M.; Vu, D.T.
- 作者Leon, R.; Okuno, J.; Ruiz, R.; Gallegos, M.; Vu, D.T.
- 文件大小663.21KB
- 发表时间2001
- DOI10.1109/GAASRW.2001.995727
- 页码23-32