![[IEEE IEEE International Radar Conference, 2005. - Arlington, VA, USA (9-12 May 2005)] IEEE International Radar Conference, 2005. - Comparison of recursive and batch processing for impact point prediction of ballistic targets]()
[IEEE IEEE International Radar Conference, 2005. - Arlington, VA, USA (9-12 May 2005)] IEEE International Radar Conference, 2005. - Comparison of recursive and batch processing for impact point prediction of ballistic targetsFarina, A.; Immediata, S.; Timmoneri, L.; Meloni, M.; Vigilante, D. · 2005