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[Springer Proceedings in Physics] Microscopy of Semiconducting Materials 2007 Volume 120 || Calculation of Debye-Waller Temperature Factors for GaAsCullis, A. G.; Midgley, P. A. · 2008
[Springer Proceedings in Physics] Microscopy of Semiconducting Materials 2007 Volume 120 || Hydrogenated Nanocrystalline Silicon Investigated by Conductive Atomic Force MicroscopyCullis, A. G.; Midgley, P. A. · 2008
[Springer Proceedings in Physics] Microscopy of Semiconducting Materials 2007 Volume 120 || EBIC Characterization of Light Emitting Structures Containing InGaN/GaN MQWCullis, A. G.; Midgley, P. A. · 2008
[Springer Proceedings in Physics] Microscopy of Semiconducting Materials 2007 Volume 120 || Three-Dimensional Field Models for Reverse Biased P-N JunctionsCullis, A. G.; Midgley, P. A. · 2008
[Springer Proceedings in Physics] Microscopy of Semiconducting Materials 2007 Volume 120 || Moore's Law and its Effect on Microscopy in the Semiconductor IndustryCullis, A. G.; Midgley, P. A. · 2008
[Springer Proceedings in Physics] Microscopy of Semiconducting Materials 2007 Volume 120 || STEMSIM—a New Software Tool for Simulation of STEM HAADF Z-Contrast ImagingCullis, A. G.; Midgley, P. A. · 2008
[Springer Proceedings in Physics] Microscopy of Semiconducting Materials 2007 Volume 120 || Electron Microscopy Analysis of AlGaN/GaN Nanowires Grown by Catalyst-Assisted Molecular Beam EpitaxyCullis, A. G.; Midgley, P. A. · 2008