[IEEE 2001 IEEE 32nd Annual Power Electronics Specialists Conference - Vancouver, BC, Canada (17-21 June 2001)] 2001 IEEE 32nd Annual Power Electronics Specialists Conference (IEEE Cat. No.01CH37230) - A robust, on-line turn-fault detection technique for induction machines based on monitoring the sequence component impedance matrix
- 作者Sang-Bin Lee, ; Tallam, R.M.; Habetler, T.G.
- 卷第4卷
- 文件大小649.95KB
- 发表时间2001
- DOI10.1109/pesc.2001.954449
- 页码2217-2223
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